About Instrument and its applications
X-ray Diffraction (XRD) is a high-tech, non-destructive technique for analyzing a wide range of materials, including fluids, metals, minerals, polymers, catalysts, plastics, pharmaceuticals, thin-film coatings, ceramics, solar cells, and semiconductors. Throughout industry and research institutions, XRD has become an indispensable method for materials investigation, characterization, and quality control. The temperature-dependent Powder X-ray diffractometer is built on a 9 KW rotating anode X-ray generator with a NaI Scintillation counter-detection system. Copper anode is used as the target material with fine focus filament as the cathode. Low temperature down to 12K is achieved using closed-cycle liquid Helium cryostat. This system has a theta-theta goniometer arrangement which keeps the sample horizontal and stationary. The Cross-Beam optics technology used in this system helps in easy changeover from Bragg-Brentano para focusing to high-intensity parallel beam geometry and vice versa depending on the application. There is also a small-angle X-ray scattering unit attached to the system. The attachments for future installations include high temperature, Grazing Incidence X-ray Diffraction (GIXRD), and X-ray Reflectometry (XRR) units.
General Information
Make- Rigaku
Model- SmartLab
Year of Installation- 2012
Sample Requirements
20mg (in fine powder form).
1mm-1mm (thin film)
10mm Pellet
Specifications
1) X-Ray Source: Cu
2) Detector: NaI Scintillation Detector
3) Smallest angular step size: 0.001
4) Angular range (2Theta): 3-130 for WAXS, 0-3 for SAXS