AMRC
Advanced Material Research Center
INDIAN INSTITUTE OF TECHNOLOGY MANDI
- 01905-267027
- amrcoffice@iitmandi.ac.in
Atomic Force Microscopy (AFM) is a high-resolution imaging technique used to study surfaces at the nanometer scale. It works by scanning a sharp tip attached to a flexible cantilever over a sample surface. As the tip moves across the surface, it experiences forces that cause the cantilever to deflect. These deflections are detected using a laser beam reflected onto a photodetector, allowing the AFM to construct a detailed topographic map of the surface. AFM can operate in air, liquid, or vacuum, and is widely used in materials science, biology, and nanotechnology for imaging, measuring, and manipulating materials at the atomic level.