AMRC

Advanced Material Research Center

INDIAN INSTITUTE OF TECHNOLOGY MANDI

  • 01905-267027
  • amrcoffice@iitmandi.ac.in

External Booking Forms

Atomic Absorption Spectrometer (AAS)
Atomic Force Microscopy (AFM)
Attenuated Total Reflectance-Fourier Transform Infrared (ATR-FTIR)
BENCHTOP POWDER X-RAY DIFFRACTION (XRD)
BET(Brunauer-Emmet-Teller) Surface Area Analyzer
Chemisorptions Analyzer
Circular dichroism (CD) Spectroscopy
Confocal Microscope
Differential Scanning Calorimetry (DSC)
Dynamic Light Scattering (DLS)
Electrochemical Analyzer
Field-Emission Scanning Electron Microscope (FE-SEM)
Fluorescence Lifetime measurement
Fluorescence Spectrophotometer
Freeze Dryer
Gas Chromatography
High Performance Liquid Chromatography (HP-LC)
High Resolution Mass Spectrometry (HR-MS) With LC-MS
High-Resolution Transmission Electron Microscopy (HR-TEM)
Inductively coupled plasma mass spectrometry (ICP-MS)
Liquid Nitrogen Plant
Magnetic Property Measuring System (MPMS)
Nuclear Magnetic Resonance (NMR) Spectroscopy
Optical microscope
Photoemission Spectroscopy
Physical Property Measurement System (PPMS)
PIPS Ion milling
Powder X-Ray Diffraction (P-XRD)
Raman & Photoluminescence spectrometer
Rheometer
Single Crystal X-ray Diffractometer (SC-XRD)
Thermo Gravimetric Analyzer coupled with Differential Scanning Calorimetry (TGA-DSC)
Thermogravimetry Analysis (TGA)
Ultraviolet-visible spectroscopy (UV-Vis)
UV-Vis-NIR spectrophotometer
X-Ray Photoelectron Spectroscopy(XPS)